Device Engineer Intern

Posted on 9/19/2025

onsemi

onsemi

Compensation Overview

$23.25 - $33.50/hr

Wappingers Falls, NY, USA

In Person

This position offers a unique opportunity to work with group of engineers on state-of-the-art technology development along with hands on experience of semiconductor device testing.

Qualifications – External
 
Qualifications In order to be considered for an internship, you must be a Master or PhD student currently enrolled in school pursuing an electrical engineering or semiconductor-related field. 
This position is specifically looking for:
  •  Graduate level classes on Semiconductor devices and wafer processing.
  •  Experience and/or understanding of semiconductor device physics and testing. 
  •  Perform statistical data analysis and present results and conclusions to the team.
  •  Occasionally help with characterization work in the laboratory 
  •  Ability to solve problems individually or as part of a team and collaborate effectively with people in different functions.
  •  Excellent verbal and written communication skills
Requirements:

 
To be considered for an internship, you must be currently enrolled in a degree seeking program. This position is specifically looking for someone who will be enrolled in [DEGREE PROGRAM].
 
Hourly: onsemi is excited to share the base salary range for this position is $23.25 to $33.50 exclusive of fringe benefits or potential bonuses. The final pay rate for the successful candidate will depend on geographic location, skills, education, experience, and/or consideration of internal equity of our current team members. We also offer a competitive benefits package. https://www.onsemi.com/site/pdf/Benefits-Summary-USA.pdf

The candidate needs to have basic knowledge of semiconductor device physics. The candidate’s duties will involve but not limited to:

 • Collaborate with engineering teams on Design of Experiments and characterization with the goal of optimizing device performance.

 • Layout of new device structures and modification of existing test structures in cadence environment.

 • Support testing of image sensor and BCD devices on fully automated and semi-automated test system, as needed.